Evaluation of total surface roughness of different optical elements designed for 1064 nm, 532 nm and 355 nm laser radiation from scattering measurements
- Unit: Faculty of Physics
- Keywords: Evaluation of total surface roughness of optical elements, scattering measurements, Ekspla, OceanOptics
The measurements are performed using the total integrated scattering measurement station with an Ekspla NL202 nanosecond laser. Scatter is measured in relation to the OceanOptics standard.
Measurement accuracy: background scatter is 1.4x10-5 (355 nm) and 4.5 x 10-6 (532 nm). Roughness can be measured from 0.5 to 10 nm. The station can perform scattering loss measurements on samples with a diameter from 12.7 to 28 mm and thickness from 2 to 6 mm.
Application. Evaluation of total integrated scattering from the whole surface of different optical elements (mirrors, filters, optical substrates, radial polarization converters) and surface roughness for mirrors, optical substrates, filters etc., which are designed for 1064nm, 532 nm and 355 nm laser radiation.
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