Method for estimation of crystal periodic poling quality
- Kryptis: Lazeriai
A non-destructive method for estimation of periodically poled crystal poling quality in the whole crystal volume, at small periods, such as significantly smaller than 10 µm, with high precision at periods equal or less than periods of poling of the periodically poled crystal using a nonlinear process based periodic poling quality measurement setup. The method is also applicable to fan-out type periodically poled crystals to estimate periodic poling quality in the whole volume where poling period should be equal.
Inventors: Julius Vengelis, Jonas Banys, Jokūbas Pimpė.
Jurisdiction: EP