The instrument BELIV-VU for barrier evaluation in the junction structures by using pulsed linearly increasing voltage
Sukurta: 20 November 2018
- Unit: Faculty of Physics
- Keywords: Barrier evaluation, photo-electrical semiconductor devices, voltage generator, oscilloscope, RIGOL, Agilent Technologies
- Responsible person: Dr. Eugenijus Gaubas, tel. +37060034126,
The BELIV-VU instrument is made at Vilnius University and consists of pulsed generator of the linearly increasing voltage of a type RIGOL DG1022, an oscilloscope of a type Agilent Technologies DS05032A and PCB for sample mounting.
This instrument is designed for analysis of the impact of the radiation, thermal and combined treatments as well as dopant distribution profiling and defect spectroscopy within a high resistivity junction layer.
Application. The instrument BELIV-VU can be applied for evaluation of barrier parameters in Si, Ge, GaAs, GaN, Cu-CdS and photo-cells. Spectral and temperature scans can be implemented using the instrument and varying measurement regimes.
