Temperature scanner of the current-voltage and capacitance-voltage characteristics

Unit: Faculty of Physics

Keywords: Current-voltage characteristics, capacitance-voltage characteristics, temperature scanner, junction structure, impact of radiation

Responsible person: Dr. Eugenijus Gaubas, tel. +37060034126,

Computer controlled temperature scanner of the current-voltage and capacitance-voltage characteristics, produced at Vilnius university, measures in the range of 0 – 600 V bias voltage and in the temperature range of 100-300 K.

The C-V characteristics are measured in the range of 10- 2´106 Hz using small test signals (20-100 mV). This measurement system is devoted for analysis of the impact of the radiation, thermal and combined treatments. These measurements can also be applied for the quality control of the junction structures and opto-electronic devices.

Application. Computer controlled temperature scanner of the current-voltage and capacitance-voltage characteristics controls the operational parameters of junction structure devices.